Heavily-Doped Germanium on Silicon with Activated Doping Exceeding 1020 cm–3 as an Alternative to Gold for Mid-Infrared Plasmonics
نویسندگان
چکیده
Ge-on-Si has been demonstrated as a platform for Si foundry compatible plasmonics. We use laser thermal annealing to demonstrate activated doping levels >1020 cm-3 which allows most of the 3 to 20 μm mid-infrared sensing window to be covered with enhancements comparable to gold plasmonics.
منابع مشابه
Tunability and Losses of Mid-infrared Plasmonics in Heavily Doped Germanium Thin Films
Heavily-doped semiconductor films are very promising for application in mid-infrared plasmonic devices because the real part of their dielectric function is negative and broadly tunable in this wavelength range. In this work we investigate heavily n-type doped germanium epilayers grown on different substrates, in-situ doped in the 10 to 10 cm range, by infrared spectroscopy, first principle cal...
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In this work, the growth and the fabrication of heavily doped germanium plasmonic antennas for mid-infrared applications is reported. By tuning the phosphorus doping concentration and the antenna geometrical parameters, plasma frequencies for targeting the 8-15 μm spectral region are achieved. 1 μm thick, heavily doped (2.3 × 10 cm ) germanium was used to fabricate dipole antennas of 800 nm wid...
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Ultra-doped n-type germanium thin films for sensing in the mid-infrared
A key milestone for the next generation of high-performance multifunctional microelectronic devices is the monolithic integration of high-mobility materials with Si technology. The use of Ge instead of Si as a basic material in nanoelectronics would need homogeneous p- and n-type doping with high carrier densities. Here we use ion implantation followed by rear side flash-lamp annealing (r-FLA) ...
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